J. (Joop) de Vries
AFM (Atomic Force Microscopy) and XPS (X-ray Photoelectron Spectroscopy)
Telephone:
+31 50 361 6071 (Work)
+31 50 36 33159 (fax)
E-mail:
joop.de.vries umcg.nl
Expertise
XPS : X-Ray Photoelctron Spectroscopy (or ESCA)
AFM: Atomic force Microscopy
AFM: Atomic force Microscopy
| Last modified: | 19 April 2024 3.29 p.m. |