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Wang, H., Pinna,
J., Romero, D. G., Di Mario, L., Koushki,
R. M., Kot, M., Portale, G. & Loi,
M. A., 9-May-2024, In: Advanced materials.36, 19,
11 p., 2311526.
Research output:Contribution to journal ›Article› Academic› peer-review
Garcia-Orrit, S., Vega-Mayoral, V., Chen, Q., Serra, G., Guizzardi,
M., Romano, V., Dal Conte, S., Cerullo, G., Di
Mario, L., Kot, M., Loi, M. A., Narita, A., Müllen, K.,
Tommasini, M. & Cabanillas-González, J., 7-Oct-2024, In:
JOURNAL OF PHYSICAL CHEMISTRY LETTERS.15, 41,
p. 10366-103749 p.
Research output:Contribution to journal ›Article› Academic› peer-review
Kot, M. & Lamhot, Y., 27-Apr-2023, Metrology, Inspection, and
Process Control XXXVII: Proceedings. Robinson, J. C. &
Sendelbach, M. J. (eds.). 3A ed.Society of Photo-Optical Instrumentation Engineers
(SPIE), (Proceedings of the Society of Photo-optical
Instrumentation Engineers; vol. 12496).
Research output:Chapter in
Book/Report/Conference proceeding ›Conference contribution› Professional
