Wang, H., Pinna,
J., Romero, D. G., Di Mario, L., Koushki,
R. M., Kot, M., Portale, G. & Loi,
M. A., 7-feb.-2024, (E-pub ahead
of print) In: Advanced
materials.11 blz.
Kot, M. & Lamhot, Y.,
27-apr.-2023, Metrology, Inspection,
and Process Control XXXVII: Proceedings. Robinson, J. C. &
Sendelbach, M. J. (redactie). 3A
redactieSociety of Photo-Optical Instrumentation
Engineers (SPIE), (Proceedings of the Society of
Photo-optical Instrumentation Engineers; vol. 12496).