J.L. (Jan) Rieck

Promovendus

Faculteit Science and Engineering

Telefoon:

E-mail:

j.l.rieck rug.nl

ORCID Research Portal

Publicaties

Ohmic Response in BiFeO3 Domain Walls by Submicron-Scale Four-Point Probe Resistance Measurements

Rieck, J. L., Kolster, M. L., Avila, R. A., Li, M., Rijnders, G., Koster, G., Palstra, T., Huijink, R. & Noheda, B., mei-2025, In: Advanced electronic materials. 11, 7, 13 blz., 2400794.

Onderzoeksoutput › › peer review

Stripe noise removal in conductive atomic force microscopy

Li, M., Rieck, J., Noheda, B., Roerdink, J. B. T. M. & Wilkinson, M. H. F., 16-feb.-2024, In: Scientific Reports. 14, 1, 14 blz., 3931.

Onderzoeksoutput › › peer review

Ferroelastic Domain Walls in BiFeO3 as Memristive Networks

Rieck, J. L., Cipollini, D., Salverda, M., Quinteros, C. P., Schomaker, L. R. B. & Noheda, B., jan.-2023, In: Advanced Intelligent Systems. 5, 1, 9 blz., 2200292.

Onderzoeksoutput › › peer review

Low-toxicity chemical solution deposition of ferroelectric Ca:HfO2

Badillo, M., Taleb, S., Mokabber, T., Rieck, J., Castanedo, R., Torres, G., Noheda, B. & Acuautla, M., 19-jan.-2023, In: Journal of Materials Chemistry C. 11, 3, blz. 1119-1133 15 blz.

Onderzoeksoutput › › peer review

Stripe Noise Removal in Scanning Probe Microscopy of Memristor Materials

Li, M., Rieck, J., Roerdink, J. B. T. M. & Wilkinson, M. H. F., jun.-2022.

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