F.A. (Farhad) Merchant, Dr

Kundu, S., Patkar, S. S., Mishra, S. M., Trivedi, G. & Merchant, F., 16-feb.-2026, (E-pub ahead of print) In: IEEE Internet of Things Journal. 25 blz.

Onderzoeksoutput › peer review

Chatterjee, D., Singh, S., Mukhopadhyay, D., Merchant, F. & Chattopadhyay, A., 2026, Security, Privacy, and Applied Cryptography Engineering - 15th International Conference, SPACE 2025, Proceedings. Karfa, C., Asadi, N. & Chattopadhyay, A. (reds.). Springer Science and Business Media Deutschland GmbH, blz. 97-113 17 blz. (Lecture Notes in Computer Science; vol. 16406 LNCS).

Onderzoeksoutput › › peer review

Jha, C. K., Singh, S., Qayyum, K., Bende, A., Hassan, M., Rana, V., Merchant, F. & Drechsler, R., 2026, In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 45, 2, blz. 845-854 10 blz.

Onderzoeksoutput › › peer review

Merchant, F., Bende, A., Fritscher, M., Kvatinsky, S., Singh, S., Rana, V., Dittmann, R., Swamy Reddy, K. D., Wenger, C., Mir, F. J., Taouil, M., Gomony, M. D., Hamdioui, S. & Corporaal, H., 1-jul.-2025, Proceedings - 2025 IEEE European Test Symposium, ETS 2025. Institute of Electrical and Electronics Engineers Inc., 10 blz. (Proceedings of the European Test Workshop).

Onderzoeksoutput › › peer review

Parrini, L., Soliman, T., Hettwer, B., De La Parra, C., Borrmann, J. M., Singh, S., Bende, A., Rana, V., Merchant, F. & Wehn, N., 16-jan.-2025, In: Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 383, 2288, 17 blz., 20230399.

Onderzoeksoutput › › peer review

Fritscher, M., Singh, S., Rizzi, T., Baroni, A., Reiser, D., Mallah, M., Hartmann, D., Bende, A., Kempen, T., Uhlmann, M., Kahmen, G., Fey, D., Rana, V., Menzel, S., Reichenbach, M., Krstic, M., Merchant, F. & Wenger, C., dec.-2024, In: Scientific Reports. 14, 1, 13 blz., 23695.

Onderzoeksoutput › › peer review

Parrini, L., Soliman, T., Hettwer, B., Borrmann, J. M., Singh, S., Bende, A., Rana, V., Merchant, F. & Wehn, N., 26-jun.-2024, 2024 IEEE European Test Symposium (ETS). IEEE, 4 blz.

Onderzoeksoutput › › peer review

Bende, A., Singh, S., Jha, C. K., Kempen, T., Cüppers, F., Bengel, C., Zambanini, A., Nielinger, D., Patkar, S., Drechsler, R., Waser, R., Merchant, F. & Rana, V., 10-jan.-2024, 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID). IEEE, blz. 565-570 6 blz. 10483456

Onderzoeksoutput › › peer review

Rajendran, G., Zahoor, F., Thakker, S. S., Singh, S., Merchant, F., Rana, V. & Chattopadhyay, A., 10-jan.-2024, 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID). IEEE, blz. 560-564 5 blz. 10483480

Onderzoeksoutput › › peer review

Singh, S., Bende, A., Jha, C. K., Rana, V., Drechsler, R., Patkar, S. & Merchant, F., 6-okt.-2024, (Submitted) arXiv, 6 blz.

Onderzoeksoutput: Voordruk ›