J. (Hugh Jiliang) Liu, MSc

Chen, X. (Guest editor), Tsuji, T. (Guest editor), Carloni, R. (Guest editor), Chen, X. (Guest editor), Chen, Z. (Guest editor), Choi, J. (Guest editor), Clayton, G. (Guest editor), Clévy, C. (Guest editor), Grebenstein, M. (Guest editor), Grossard, M. (Guest editor), Ito, K. (Guest editor), Jeon, S. (Guest editor), Lan, C. C. (Guest editor), Liu, G. (Guest editor), Liu, H. (Guest editor), Liu, H. H. (Guest editor), Manzie, C., Oldham, K. (Guest editor), Pan, Y. J. (Guest editor) & Shyrokau, B. (Guest editor) & 9 others, Shi, D. (Guest editor), Shimono, T. (Guest editor), Tavakoli, M. (Guest editor), Wan, Y. (Guest editor), Wollherr, D. (Guest editor), Yao, J. (Guest editor), Yi, J. (Guest editor), Yu, H. (Guest editor) & Zhu, G. (Guest editor), 1-Aug-2022, In: IEEE/ASME Transactions on Mechatronics. 27, 4, p. 1817-1819 3 p.

Research output: Contribution to journal › Editorial › Academic › peer-review