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{
"requiresCookieConsentCheck": "true",
"checkedCookieConsent": "no",
"hasCookieConsent": "no"
}
Fouad, F., Saleem, B. R., Tielliu, I. F. J., Pegorer, M. A., Bellosta,
R., Esposito, D., Fargion, A. T., Zeebregts,
C. J., de Vries, J. P. P. M.
& Schuurmann, R. C. L., Feb-2026, In:
Journal of Endovascular Therapy.33, 1,
p. 267-2759
p.
Research output:Contribution to journal ›Article› Academic› peer-review
Momand, G., van der Laan, M. J., Zeebregts, C. J. & Tielliu, I. F. J., Oct-2025, In:
Journal of Vascular Surgery Cases, Innovations and
Techniques.11, 5, 5
p., 101878.
Research output:Contribution to journal ›Article› Academic› peer-review
Usai, M. V., Gargiulo, M., Haulon, S., Tielliu, I., Böckler, D., Verhagen, H.,
Fernández, A. M. & Austermann, M. J., Feb-2025, In:
Journal of Vascular Surgery.81, 2,
p. 319-323.e16 p.
Research output:Contribution to journal ›Article› Academic› peer-review
van Leeuwen, G. L., Baggel, S., Tielliu, I. F. J., Schuurmann, R. C. L., van Walraven, L. A.
& de Vries, J. P. P. M., Oct-2025, In:
European Journal of Vascular and Endovascular
Surgery.70, 4, p.
483-4897 p.
Research output:Contribution to journal ›Article› Academic› peer-review
Huistra, E. W. M., Tielliu, I. F. J., Mazuri, A., Kater, G.
M. & Zeebregts, C. J., Oct-2025, In:
Journal of Vascular Surgery Cases, Innovations and
Techniques.11, 5, 5
p.
Research output:Contribution to journal ›Article› Academic› peer-review