Ph.D Thesis: X-ray
Reflectivity and Scanning Tunnelling Microscopy
Study of Kinetic Roughening of Ag Films (USA, 1992-1994, Thesis advisor. Prof. J. Krim)
Publications
(1993-present):
[1] G. Palasantzas
and J. Krim,Effect of the form of the
height-height correlation function on diffuse x-ray scattering from a
self-affine surface, Phys. Rev. B 48, 2873 (1993).
[2] G.
Palasantzas, Power spectrum and surface width of self-affine fractal surfaces
via the k-correlation model, Phys. Rev. B 48, 14472 (1993); 49, 5785
(1994).
[3] G.
Palasantzas, Self-affine fractals and the limit H=0, Phys. Rev. E
49, 1740 (1994).
[4] G.
Palasantzas, Splitting of the dispersion relation of surface plasmons on rough self-affine fractal
surfaces, Phys. Rev. B 49, 5726 (1994).
[5] G.
Palasantzas, Finite size effects on self-affine fractals due to
domains, Phys. Rev. B 49, 10544 (1994).
[6] G.
Palasantzas, Study of the frequency sift of a quartz crystal oscillator bounded
with a self-affine fractal surface in contact with a liquid, Phys. Rev. E
50, 1682 (1994).
[7] G.
Palasantzas, Self-affine case for the roughness effect on the frictional force
in boundary lubrication, Phys. Rev. E 50, 4256 (1994).
[8] G.
Palasantzas, Eigenwave spectrum of surface
sound waves in media bounded by self-affine fractals, Phys. Rev. B 50,
18670 (1994).
[9] C.
Thompson, G. Palasantzas, Y.P. Feng, S.K. Sinha, and J. Krim, X-ray reflectivity of vapor-deposited silver
films, Phys. Rev. B 49, 4902 (1994).
[10] G.
Palasantzas and J. Krim,Scanning Tunneling
Microscopy of the thick-film limit of kinetic roughening, Phys. Rev. Lett.
73, 3564 (1994).
[11] G.
Palasantzas and J. Krim, Mechanisms of Thin
Film Evolution:Scanning Tunneling
Microscopy study of the scaling behavior of vapor-deposited silver
films, Mat. Res. Soc. Symp. Proc. 317, 111
(1994).
[12] G.
Palasantzas, Wetting on rough self-affine surfaces, Phys. Rev. B 51,
14612 (1995)
[13] G.
Palasantzas, Slope-slope correlation functions for self-affine fractal
morphologies Solid State Commun. 100, 699
(1996).
[14] G.
Palasantzas, A Study of (1+1)-Dimensional Height-Height Correlation Functions
for Self-Affine Fractal Morphologies. Solid State Commun.
100, 705 (1996).
[15] J. Krim and G. Palasantzas, Experimental observation of
self-affine scaling and kinetic roughening at submicron length scales (Review
article), Int. J. Mod. Phys. B 9, 599 (1995).
[16] G.
Palasantzas and E. Koumanakos, Roughness Effect
on Thin-Film Heterojunction Photovoltaic Elements, J. Appl. Phys. 79, 8531
(1996).
[17] G.
Palasantzas and G. Backx, Membranes on rough
self-affine surfaces, Phys. Rev. B 54, 8213 (1996).
[18] G.
Palasantzas, Roughness effect on the thermal stability of thin films. J.
Appl. Phys. 81, 246 (1997).
[19] G.
Palasantzas, Roughness effects on the electrostatic-image potential near a
dielectric interface. J. Appl. Phys. 82, 351 (1997).
[20] G.
Palasantzas, Static and Dynamic aspects of the rms-local
surface slope of growing random surfaces. Phys. Rev. E 56, 1254 (1997).
[21] G.
Palasantzas and J. Barnas, Surface
roughness fractality effects in electrical
conductivity of single metallic and semiconducting films. Phys. Rev. B 56,
7726 (1997).
[22] G.
Palasantzas, and G. Backx, Fluctuation
properties of interfaces and membranes bounded by rough surfaces. Phys.
Rev. B 55, 9371 (1997).
[23]. G.
Palasantzas and L. J. Geerligs, Kinetic
properties of particles forming rough surfaces. Solid State Commun. 103, 555 (1997).
[24] J. Barnas and G. Palasantzas, Interface Roughness Fractality effects in the Giant-Magnetoresistance in
magnetic multilayers. J. Appl. Phys. 82, 3950 (1997).
[25] G.
Palasantzas and G. Backx, Study of fluid
interface fluctuations within the generalised Dergaguin approximation. Phys. Rev. B 56, 6478
(1997).
[26] G.
Palasantzas, Roughness effects on the fracture toughness of materials under
uniaxial stress, J. Appl. Phys 83,
5212 (1998).
[27] G.
Palasantzas, Surface roughness and grain boundary scattering effects on the
electrical conductivity of thin films. Phys. Rev. B 58, 9685 (1998).
[28] G.
Palasantzas and G. Backx, Effects on fluid
interface fluctuations due to the interaction potential form: The case of
exponential interactions . Phys. Rev. B 57, 14650 (1998).
[29] G.
Palasantzas, and A. Widom, Roughness effects on
the sliding frictional force of submonolayer liquid
films on solid substrates . Phys. Rev. B 57, 4764 (1998).
[30] G.
Palasantzas, J. Barnas, and L.J. Geerligs, Interface roughness fractality effects
on the electron mobility in semiconducting quantum wells. Phys. Stat.
Solidi B. 209, 319 (1998).
[31] G.
Palasantzas, B. Ilge, L. J. Geelings, and J. M. M. de Nijs,
Diffusion, nucleation, and annealing of Co on the H-passivated Si(100) surface
studied by UHV-STM. Surf. Sci. 412-413, 509 (1998).
[32] M.
R. Zuiddam, S. Rogge, L.J. Geerligs, E. van der Drift, B. Ilge,
and G. Palasantzas, Contact and alignment marker technology for atomic scale
device fabrication, Microelectronics Engineering 41-42, 567 (1998).
[33] B. Ilge, G. Palasantzas, L. J. Geelings,
and J. M. M. de Nijs, The temperature evolution
of ultra-thin films in solid phase reaction of Co with Si(111) studied by
scanning tunneling microscopy. Surf. Sci. 414, 279 (1998).
[34] L.
J. Geerligs, S. Rogge, G. Palasantzas,
B. Ilge, P. Scholte, J. de Nijs NEXT: An Experimental Effort Towards Nanoelectronic Devices, (3rd International Symposium
of Advanced Physical Fields-98). J. Surf. Analysis 4, 204 (1998).
[35] G. Palsantzas, Enhancement of proximity effects due to random
roughness at a Superconductor/Metal interface, Solid State Commun. 112, 97 (1999).
[36] G.
Palasantzas, Static and dynamic aspects of the demagnetizing factor in magnetic
thin films with random rough surfaces, J. Appl. Phys. 86, 2196 (1999).
[37] G.
Palasantzas and G. Backx, Roughness induced
fluid interface fluctuations due to polar and apolar interactions, Phys.
Rev. E 59, 1959 (1999).
[38] Y. -P.
Zhao, G. Palasantzas, G. -C. Wang, and J. Th. M. De Hosson,
Surface/interface roughness induced demagnetizing effects in thin magnetic
films, Phys. Rev. B 60, 1216 (1999).
[39] G.
Palasantzas and J. Barnas, Conductivity of
quantum wires with boundary roughness scattering, Phys. Stat. Sol. B 211,
671 (1999).
[40] Y. -P.
Zhao, G. -C. Wang, T. -M. Lu, G. Palasantzas, and J. Th. M. De Hosson, Surface roughness effects on capacitance and
leakage current of an insulating film, Phys. Rev. B 60, 9127 (1999).
[41] G.
Palasantzas, B. Ilge, J. M. M. de Nijs, and L. J. Geelings,
Fabrication of Co/Si nanowires by ultra-high vaccum scanning
tunneling microscopy on the Hydrogen-passivated Si(100) surface. J. Appl.
Phys. 85, 1907 (1999).
[42] G.
Palasantzas, B. Ilge, S. Rogge, and L. J. Geerligs, Technology of nanoelectronic devices
based on ultra-high vacuum scanning tunneling microscopy on the Si(100)
surface, Microelectronics Engineering 46, 133 (1999).
[43] B. Ilge, G. Palasantzas, and L. J. Geelings, Submonolayer growth of Co on H-passivated Si(100)
surfaces and nanoscale metallization with Co on patterned H-Si(100). Appl.
Surf. Sci. 144-145, 543 (1999).
[44] D. T. L.
van Agterveld, G. Palasantzas, and J. Th. M.
De Hosson, Magnesium surface segregation and
oxidation in Al-Mg alloys by ultra-high-vacuum scanning Auger and electron
microscopy, Appl. Surf. Sci. 152, 250 (1999)
[45] D. T. L.
van Agterveld, G. Palasantzas and J. Th. M.
De Hosson Surface sensitivityeffects with
local probe scanning Auger-scanning electron microscopy, Appl. Phys. Lett.
75, 1080 (1999)
[46] G. Palsantzas, Y. -P. Zhao, G. -C. Wang, T. -M. Lu, J. Barnas, and J. Th. M. De Hosson,
Electrical conductivity and thin film growth dynamics, Phys. Rev. B 61,
11109 (2000).
[47] G. Palsantzas, J. Barnas, and
J. Th. M. De Hosson, Self-affine roughness
effects on the transmission coefficient and tunnel current in thick tunnel
junctions, J. Appl. Phys. 88, 927 (2000).
[48] G.
Palasantzas, and J. Th. M. De Hosson, Rroughness effect on the measurement of interface
stress, Act. Mater. 48, 3641 (2000).
[49] G.
Palasantzas and J. Th. M. De Hosson, Fractality aspects during agglomeration of
solid-phase-epitaxy Co-silicide thin films, J. Vac. Sci. Technol. B 18,
2472 (2000).
[50] G.
Palasantzas, J. Barnas, and J. Th. M. De Hosson, Correlated roughness effects on the giant
magnetoresistance of magnetic multilayers, Acta Phys.
Pol. A 97, 495 (2000).
[51] G. Palsantzas, Y. -P. Zhao, G. -C. Wang, T. -M. Lu, and J. Th.
M. De Hosson, Roughness effects on magnetic
properties of thin films, Physica B 283,
199 (2000)
[52] G. Palsantzas and J. Th. M. Hosson,
Influence of proximity effects in superconductor/normal-metal junctions from
mound roughness and film growth mechanisms, Physica C
330, 99 (2000).
[53] D. T. L.
van Agterveld, G. Palasantzas, J. Th. M.
De Hosson, Local probe scanning Auger �scanning electron microscopy studies
of segregation and surface roughness effects after in-situ
fracture, Microstructural Investigation and Analysis, Eds. B. Jouffrey and J. Svejcar (Wiley-VCH, Weinheim, Germany, 2000), pp.87-93.
[54] D. T. L.
van Agterveld, G. Palasantzas and J. Th. M.
De Hosson, Effects of Cu-Sulphide precipitates
in Cu upon impact fracture: An ultra-high-vacuum study with Scanning
Auger/Electron Microscopy, Act. Mater. 48, 1995 (2000)
[55] G.
Palasantzas and J. Th. M. De Hosson, Electrical
conductivity of thin films grown in a quasi-layer-by-layer mode, Phys.
Rev. B 63, 125404 (2001).
[56] G.
Palasantzas and J. Th. M. De Hosson, Influence
of quasi-layer-by-layer roughness on proximity effects in thin film
superconducting/normal-metal junctions, Physica C
355, 211 (2001).
[57] Y. -P.
Zhao, G. Palasantzas, R. M. Gamache, G. -C.
Wang, T. -M. Lu, and J. Th. M. De Hosson, Effect
of Surface Roughness on Magnetic Domain Wall Thickness, Domain Size and Coercivity J. Appl. Phys. 89, 13 25 (2001).
[58] G.
Palasantzas, J. Barnas, and J. Th. M. De Hosson, Non-conformal interface roughness effects on
the giant magnetoresistance in magnetic multilayers, Surf. Sci. 482-485,
1026 (2001).
[59] G.
Palasantzas and J. Th. M. De Hosson, Mound
surface roughness effects on the thermal capacitance of thin films. J.
Appl. Phys. 89, 6130 (2001).
[60] G.
Palasantzas and J. Th. M. De Hosson, The effect
of mound surface roughness effects on the electrical capacitance of thin
films, Sol. State. Commun. 118, 203 (2001).
[61] G.
Palasantzas and J. Th. M. De Hosson, Linear
growth of thin films under the influence of stress due to film/substrate
lattice mismatch, Appl. Phys. Lett. 78, 3044 (2001).
[62] G.
Palasantzas and J. Th. M. De Hosson, Partial
wetting on random rough surfaces, Acta Materialia 49, 3533 (2001).
[63] G.
Palasantzas, D. T. L van Agterveld, S. A. Koch,
J. Th. M. De Hosson, Flux effects on electron
beam induced oxidation of Ni3Al surfaces, J. Vac. Sci. Technol A 19, 2581 (2001).
[64] G.
Palasantzas, J. Barnas, and J. Th. M. De Hosson, Effects of roughness on magneto-electrical
properties in thin films Proc. Int. Conf. of Comp. Engn. (ICCE/8) (ed. D. Hui), 711-712 (2001).
[65] G.
Palasantzas, J. Barn�s,
and J. Th. M. De Hosson, Correlated roughness
effects on the conductivity of quantum wires, J. Appl. Phys.89, 8002
(2001).
[66] D. Tsamouras, G. Palasantzas, J. Th. M. De Hosson, Growth front roughening of room temperature
deposited oligomer thin films, Mat. Res. Soc. Proc. 648, P.6.20.1 (2001).
[67] D. Tsamouras, G. Palasantzas, J. Th. M. De Hosson, Growth front roughening of room temperature
vapor deposited ppv-oligomer films, Appl. Phys.
Lett. 79, 1801 (2001).
[68] S. A.
Koch, D. T. L. van Agterveld, G. Palasantzas and
J. Th. M. De Hosson, Electron beam induced
oxidation of surfaces of Ni3Al- base alloys, Surf. Sci. Lett.
L67, 476 (2001).
[69] S. A.
Koch, D. T. L. van Agterveld, G. Palasantzas and
J. Th. M. De Hosson, B segregation on grain
boundary surfaces of intergranular fractured
Ni-Al-alloys under UHV conditions, Surf. Sci. 482-485, 254 (2001).
[70] D. T. L.
van Agterveld, G. Palasantzas, J. Th. M.
De Hosson, Surface sensitivity effects with
local probe scanning Auger-Scanning Electron microscopy, Mat. Res.
Soc. Symp. Proc.589, 81-86 (2001).
[71] S. A.
Koch, D. T. L van Agterveld, G. Palasantzas, J.
Th. M. De Hosson , Influence of
oxidation on Boron segregation to grain boundaries of in-situ fractured Ni3Al
alloys, Mat.Res.Soc.Proc.648, AA.3.12.1, (2001).
[72] G.
Palasantzas, Thickness dependent thermal capacitance of thin films with
rough boundaries, Sol. State Commun.
122,523 (2002).
[73] D. Tsamouras and G. Palasantzas, Temperature dependence
of the growth front roughening of oligomer films, Appl. Phys. Lett. 80,
4528 (2002).
[74] G.
Palasantzas, J. Th. M. De Hosson, and J. Barnas, Surface/interface roughness effects on
magneto-electrical properties of thin films, Surf. Sci. 507-510, 541
(2002).
[75] D. Tsamouras, G. Palasantzas, J. Th. M. De Hosson, Roughening aspects of room temperature vapor
deposited oligomer thin films onto Si substrates, Surf. Sci. 507-510, 357
(2002)
[76] G.
Palasantzas, D. T. L. van Agterveld, G.
Palasantzas and J. Th. M. De Hosson, Electron
beam induced oxidation of Al-Mg alloys, Appl. Surf. Sci. 191, 266 (2002).
[77] G.
Palasantzas , S. A. Koch, J. Th. M. De Hosson,
Growth front roughening of room temperature deposited copper nanocluster
films, Appl. Phys. Lett. 81, 1089 (2002).
[78] G.
Palasantzas and G. Backx, Triple-point wetting
of van der Waals films on self-affine and mound rough surfaces, Phys. Rev.
E 66, 021604-1 (2002).
[79] G.
Palasantzas and G. Backx, Self-affine and mound
roughness effects on the double layer charge capacitance, J. Appl. Phys.
92, 7175 (2002).
[80] S. A.
Koch, G. Palasantzas, D. T. L. van Agterveld, and
J. Th. M. De Hosson, Electron beam induced
oxidation of Ni3Al alloys under UHV conditions:Electron flux
effects, Surf. Sci. 507-510, 486(2002).
[81] G.
Palasantzas, Bias voltage influence on the shape of cobalt-silicide
nanowires, Sol. State Commun. 127, 219
(2003).
[82] G.
Palasantzas, Influence of self-affine surface roughness on the friction
coefficient for rubbers, J. Appl. Phys. 94, 5652 (2003).
[83] G.
Palasantzas, Contact area calculation between elastic solids bounded by mound
rough surfaces, Sol. State Commun. 125, 611
(2003).
[84] G.
Palasantzas, Adhesion of elastic films on mound rough surfaces, Surf. Sci.
529, 527 (2003).
[85] G.
Palasantzas and G.M.E.A. Backx, Roughness
effects on the double-layer charge capacitance: The case of Helmholtz layer
induced electrode roughness attenuation ' Surf. Sci. 540, 401 (2003).
[86] G.
Palasantzas and G.M.E.A. Backx, Wetting of van
der Waals solid films on self-affine rough surfaces, Phys. Rev. B 68,
035412 (2003).
[87] G.
Palasantzas and G. Backx, Self-affine
roughness effects on the double-layer charge density and capacitance in the
non-linear regime, J. Chem. Phys. 118, 4631 (2003)
[88] G.
Palasantzas and J. Th. M. De Hosson, Roughness
effects on the conductivity of semiconducting thin films/quantum wells with
double rough boundaries, J. Appl. Phys. 93, 320 (2003).
[89] G.
Palasantzas and J. Th. M. De Hosson, Evolution
of normal stress and surface roughness in buckled thin films, J. Appl.
Phys. 93, 893 (2003)
[90] G.
Palasantzas, J. Th. M. De Hosson, Self-affine
roughness effects on the contact area between elastic bodies, J. Appl.
Phys. 93, 898 (2003)
[91] G.
Palasantzas, J. Th. M. De Hosson, Influence of
surface roughness on the adhesion of elastic films, Phys. Rev. E 67,
021604 (2003).
[92] G.
Palasantzas and J. Th. M. De Hosson, The
influence of roughness on the detachment force of elastic films from
self-affine rough surfaces, J. Appl. Phys. 94, 3041 (2003).
[93] G.
Palasantzas, S. A. Koch, J. Th. M. De Hosson,
Growth and Morphology of Low-Energy Deposited Cu Nanocluster
Films, Reviews on Advanced Materials SCIENCE (RAMS) 5, 57 (2003).
[94] T. Vystavel, G. Palasantzas, S. A. Koch, J. Th. M. De Hosson, Nano-sized iron clusters investigated with in-situ
transmission electron microscopy, Appl. Phys. Lett. 82, 197 (2003)
[95] T. Vystavel, G. Palasantzas, S. A. Koch, J. Th. M. De Hosson, Niobium nanoclusters studied with in situ
transmission electron microscopy, Appl. Phys. Lett. 83, 3909 (2003).
[96] G. Palasantzas, Nanoscale roughness effects on thin film
functional properties, RECENT RESEARCH DEVELOPMENTS
IN PHYSICS (Transworld Research Network) 4, 361-386 (2003).
/ Invited
[97] G.
Palasantzas, Influence of self-affine and mound roughness on the surface
impedance and skin depth of conductive materials, J. Phys. Chem. Sol. 65,
1271 (2004).
[98] G.
Palasantzas, Self-affine roughness influence on the friction coeficient for rubbers onto solid surfaces, J. Chem. Phys. 120, 2889 (2004).
[99] G.
Palasantzas, Influence of Self-affine roughness on the adhesive friction
coefficient of a rubber body sliding on a solid substrate, Surf. Sci. 565, 191
(2004).
[100] G.
Palasantzas, Ballistic thermal conductance limited by phonon roughness
scattering: A comparison of power-law and Gaussian roughness, Phys. Rev. B 70,
153404 (2004).
[101] G.
Palasantzas, Influence of self-affine roughness on the friction coefficient of
rubber at high sliding velocity, Phys. Rev. B 70, 195409 (2004)
[102] G.
Palasantzas and G. M. E. A. Backx, Influence of
self-affine roughness on Parson-Zobel plots for
electrical double layers, Phys. Rev. E 69, 041603 (2004).
[103] G.
Palasantzas and J. Th. M. DeHosson, Effects of
self-affine surface roughness on the friction coefficient of rubbers in the
presence of a liquid interlayer, J. Appl. Phys. 95, 389 (2004).
[104] G.
Palasantzas, H. J. Kooij, and J. Th. M. DeHosson, Carbon induced metal dusting of iron-nickel-chromium
alloy surfaces: a scanning auger microscopy study, Appl. Surf. Sci. 229,
190 (2004).
[105] G.
Palasantzas and J. Th. M. DeHosson, Influence of self-affine
roughness on the detachment stress at an elastic-inelastic interface,
Phys. Rev. B 69, 155408 (2004).
[106] S. A.
Koch, R. H. te Velde,
G. Palasantzas, J. Th. M. De Hosson, Magnetic
Force Microscopy of Co nanocluster films, Appl. Surf. Sci. 226, 185
(2004).
[107] J. Th.
M. DeHosson, G. Palasantzas, T. Vystavel, and S. A. Koch, Nanosized Metal
Clusters: Challenges and Opportunities, JOM 56, 40 (2004).
[108] S. A.
Koch, R. H. te Velde,
G. Palasantzas, J. Th. M. De Hosson, Magnetic
versus structural properties of Co nanocluster thin films: A magnetic force
microscopy study, Appl. Phys. Lett 84, 556 (2004).
[109] J. Th.
M. De Hosson, G. Palasantzas, T. Vystavel, S. A. Koch, Structural stability of nano-sized clusters, Mat. Res. Soc. Proc. 791, Q.8.2.1
(2004).
[110] Vystavel,T., Palasantzas,G., Koch,S.A. & De Hosson,J.T.M.
Structural aspects of transition metal nanoclusters studied with transmission
electron microscopy. Proceedings 13th European Microscopy Congress. 99-100.
2004. Antwerp, Belgium.
[110] De Hosson,J.T.M., Vystavel,T., Palasantzas,G. & Koch,S.A.
Nano-sized metal clusters. Proceedings 13th European Microscopy Congress.
575-576. 2004. Antwerp, Belgium.
[111] G. Palasantzas, L. J. Geerligs,
and J. Th. M. DeHosson,UHV-SPM
Nanofabrication, ENCYCLOPEDIA OF NANOSCIENCE AND
NANOTECHNOLOGY* Vol.
10, 581-594 (2004). / Invited
[113] G. Palasantzas and J. Th. M. De Hosson, Electrified
interfaces: Influence of self-affine electrode roughness on the
charge capacitance in electrical double-layers, SURFACE SCIENCE RESEARCH
DEVELOPMENTS, Nova Science
Publications (2004). /Invited
[114] G. Palasantzas and J. Th. M. DeHosson, Adhesion
and friction of viscoelastic media on self-affine rough surfaces, RECENT RESEARCH DEVELOPMENTS IN CHEMICAL
PHYSICS (Transworld Research Network) Vol. 8, 373 (2004).
/Invited
[115] G.
Palasantzas, S. Koch, T. Vystavel, J. Th. M.
De Hosson, Nano-Sized Cobalt Cluster Films:
Structural Stability and functionality, (invited research news paper) Advanced Engineering Materials 7, 21 (2005).
[116] C. B. Craus, G. Palasantzas, A. R. Chezan, J. Th. M. De Hosson, D.
O. Boerma, and L. Niesen ,
The influence of the surface topography on the magnetization dynamics in
soft magnetic thin films, J. Appl. Phys. 97, 013904 (2005).
[117] G. Palasantzas, Comparison of
hysteric and adhesive coefficient of friction for rubbers slidding onto self-affine rough surfaces, J. Appl.
Phys. 97, 034906 (2005).
[118] G.
Palasantzas, S. Koch, T. Vystavel, J. Th. M.
De Hosson, C. Binns,
S. Louch, Magnetic and structural properties of
Co nanocluster thin films, Phys. Rev. B 71, 085410 (2005)
[119] G.
Palasantzas, Influence of self-affine interface roughness on the charge
capacitance between two dielectric media, Phys. Rev. B 71, 075309 (2005).
[120] T. Vystavel, G. Palasantzas, S. A. Koch, J. Th. M. De Hosson, Structural dynamics of gas phase molybdenum metal
nanoclusters: transmission electron microscopy study, Appl. Phys. Lett. 86,
113113 (2005).
[121] G.
Palasantzas, Self-affine roughness influence on redox reaction charge
admittance, Surf. Sci. 582, 151 (2005).
[122] G.
Palasantzas, Influence of anomalous roughness growth on the electrical
conductivity of thin films, Phys. Rev. B 71, 205320 (2005).
[123] G.
Palasantzas, Self-affine roughness influence on the Casimir effect, J. Appl.
Phys. (RC) 97, 126104-1 (2005)
[124] G.
Palasantzas, Self-affine roughness influence on the pull-in voltage in
capacitive electromechanical devices, J. Appl. Phys. 98, 034505 (2005).
[125] T. Vystavel, S.A. Koch, G. Palasantzas, J.Th.M. De Hosson, In situ
transmission electron microscopy studies on structural dynamics of transition
metal nanoclusters (Special Focus Issue: In Situ Transmission Electron
Microscopy), J. Materials Res. 20, 1785-1791 (2005).
[126] G.
Palasantzas and J. Th. M. De Hosson,Pull-in
characteristics of electromechanical switches in the presence of Casimir
forces: Influence of self-affine surface roughness, Phys. Rev. B 72,
115426 (2005).
[127] G.
Palasantzas and J. Th. M. De Hosson, Phase
maps of microelectromechanical switches in the presence of electrostatic and
Casimir forces, Phys. Rev. B 72, 121409 (2005) (RC).
[128] G.
Palasantzas, Thin films from gas phase nanoparticles: Structure and
functionality, (Invited), NEVAC 43 (2), 36 (2005) .
[129] G. Palasantzas, J. Th. M. DeHosson,
K. F. L. Michielsen, and D. G. Stavenga, Optical Properties and Wettability
of Nanostructured Biomaterials: Moth eyes, Lotus Leaves,
and Insect Wings, HANDBOOK OF NANOSTRUCTURED BIOMATERIALS AND THEIR APPLICATIONS
IN NANOBIOTECHNOLOGY, Vol. 1, Biomaterials (2005)/Invited
[130] D.G. Stavenga, S. Foletti, G.
Palasantzas, K. Arikawa, Light on the moth-eye
corneal nipple array of butterflies, Proc. R. Soc. B 273, 661 (2006).
[131] G.
Palasantzas, T. Vystavel, S.A. Koch, , J.Th.M. De Hosson,
Coalescence aspects of cobalt nanoparticles during in-situ high temperature
annealing, J. Appl. Phys. 99, 024307 (2006).
[132] G.
Palasantzas and J. Th. M. De Hosson, Surface
roughness influence on the pull-in voltage of microswitches in
presence of thermal and quantum vacuum fluctuations, Surf. Sci. 600, 1450
(2006).
[133] G.
Palasantzas, Adhesion stability of rough elastic films in presence of quantum
vacuum fluctuations, J. Adhesion Science and Technology 20, 1321 (2006).
[134] G. Palasantzas,
Capillary condensation and quantum vacuum effects on the pull-in voltage of
electrostatic switches with self-affine rough plates, J. Appl. Phys. 100,
054503 (2006).
[135] B. J. Kooi, G. Palasantzas, and J. Th. M. DeHosson, Gas phase synthesis of magnesium nanoparticles: A
high resolution transamission electron
microscopy study, Appl. Phys. Lett. 89, 161914 (2006).
[136] B.
J. Kooi and G. Palasantzas (invited), Nanodeeltjes en H2 Opslag, (Invited), NEVAC 44, 97 (2006).
[137] G.
Palasantzas, Contact angle influence on the pull-in voltage of electrostatic
switches in presence of capillary condensation and quantum vacuum effects, J.
Appl. Phys. 101, 053512 (2007)
[138] G.
Palasantzas, Random surface roughness influence on gas damped nanoresonators, Appl. Phys. Lett. 90, 0411914 (2007)
[139] G.
Palasantzas, Pull-in voltage of microswitch rough
plates in presence of electromagnetic and acoustic Casimir forces, J. Appl.
Phys. 101, 063548 (2007)
[140] G.
Palasantzas, Adsorption-desorption noise influence on mass sensitivity and
dynamic range of nanoresonators with rough
surfaces, J. Appl. Phys.(RC) 101, 076103 (2007).
[141] G.
Palasantzas, Dynamic range of nanoresonators with
random rough surfaces in presence of thermomechanical and momentum exchange
noise, Appl. Phys. Lett. 91, 021901 (2007).
[142] G.
Palasantzas, Allan variance of frequency fluctuations due to momentum exchange
and thermomechanical noise, J. Appl. Phys. 102, 076111 (2007) (RC).
[143] P.J.
van Zwol, G. Palasantzas, J. Th. M. DeHosson, Influence of random roughness on the adhesion
between metal surfaces due to capillary condensation, Appl. Phys. Lett. 91,
101905 (2007).
[144] Ramanathaswamy Pandian, B. J. Kooi,
G. Palasantzas, J. Th. M. DeHosson, A. Pauza, Nanoscale electrolytic switching in phase-change
chalcogenide films, Adv. Mater. 19, 4431 (2007).
[145] A.
Morelli, Sriram Venkatesan,
G. Palasantzas, B. J. Kooi, J. Th. M. DeHosson, Polarization retention loss in PbTiO3
ferroelectric films due to leakage currents, J. Appl. Phys. 102, 084103 (2007).
[146] P.J.
van Zwol, G. Palasantzas, J. Th. M. DeHosson, Roughness corrections to the Casimir force: The importance of local surface
slope, Appl. Phys. Lett. 91, 144108 (2007).
[147] Ramanathaswamy Pandian, B. J. Kooi,
G. Palasantzas, J. Th. M. DeHosson,
Polarity-dependent reversible resistance switching in Ge-Sb-Te phase-change
thin films, Appl. Phys. Lett. 91, 152103 (2007).
[148] G.
Palasantzas, T. Vystavel, S.A. Koch, , J.Th.M. De Hosson,
Opportunities from the nanowold: Gas phase
nanoparticles, Journal of Alloys
and Compounds 449, 237 (2008).
[149] P.J.
van Zwol, G. Palasantzas, J. Th. M. DeHosson, Influence of random roughness on the Casimir
force at small separations, Phys. Rev. B B 77,
075412 (2008).
[150] P.J.
van Zwol, G. Palasantzas, M. van de Schootbrugge, J. Th. M. De Hosson,
Measurement of dispersive forces between evaporated metal surfaces in the range
below 100 nm, Appl. Phys. Lett. 92, 054101 (2008).
[151] V.B. Svetovoy, P.J. van Zwol, G.
Palasantzas, J.Th.M. De Hosson,
Optical properties of gold films and the Casimir force, Phys. Rev. B 77, 035439
(2008).
[152] G.
Palasantzas, Surface roughness influence on the quality factor of high
frequency nanoresonators, J. Appl. Phys. 103,
046106 (2008)/(RC).
[153] G. Palasantzas,
Limit to mass sensitivity of nanoresonators with
random rough surfaces due to intrinsic sources and interactions with the
surrounding gas, J. Appl. Phys. 104, 016107 (2008)
(RC)
[154] P.J. van Zwol, G. Palasantzas, M. van de Schootbrugge,
J. Th. M de Hosson,
V. S. J. Craig, Roughness of microspheres for force measurements, Langmuir 24,
7528 (2008).
[155] A. Morelli,
G. Palasantzas, J. Th. M. DeHosson, Piezoresponse force microscopy of ferroelectric thin
films: Frequency dependence of phase imaging, J. Appl. Phys. 103, 114109
(2008).
[156] G.
Palasantzas, Quality factor due to roughness scattering of shear horizontal
surface acoustic waves in nanoresonators, J.
Appl. Phys. 104, 053524 (2008)
[157] G.
Palasantzas, Surface roughness influence on parametric amplification of nanoresonators in presence of thermomechanical and
environmental noise, J. Appl. Phys. 104, 046104 (2008) (RC)
[158] Ramanathaswamn Pandian, Bart J. Kooi, George Palasantzas and Jeff De Hosson, Reversible Electrical Resistance Switching in GeSbTe Thin Films: An Electrolytic Approach Without
Amorphous-Crystalline Phase-Change, Mater. Res. Soc. Symp.
Proc. Vol. 1071, 1071-F09-09 (2008)
[159] P.J.
van Zwol, G. Palasantzas, J. Th. M de Hosson, Influence of surface roughness on capillary and
Casimir forces, PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL
ENGINEERING, Vol. 6800, p. 6800 0E (2008).
[160] Sriram Venkatesan, Ard Vlooswijk, Bart J. Kooi, Alessio Morelli,
George Palasantzas, Jeff T.M. De Hosson, and
Beatriz Noheda, Monodomain strained
ferroelectric PTO thin films: Phase transition and critical thickness
study, Phys. Rev. B 78, 104112 (2008).
[161] P.J.
van Zwol, G. Palasantzas, J. Th. M de Hosson, Influence of roughness on capillary forces between
hydrophilic surfaces, Phys. Rev. E 78, 031606 (2008)
[162] G.
Palasantzas, P.J. van Zwol, J. Th. M de Hosson, Transition from Casimir to van der Waals force
between macroscopic bodies, Appl. Phys. Lett. 93, 121912 (2008).
[163] G.
Palasantzas, P.J. van Zwol, J. Th. M de Hosson, Het Casimir effekt: gebaseered op iets of helemaal niets? NEVACBLAD 46, 11 (2008) (invited).
[164] G.
Palasantzas, P.J. van Zwol, J. Th. M de Hosson, Influence of material properties on the Casimir
force, International Journal of Nanosystems 1,
175, (2008).
[165] Alessio Morelli, Sriram Venkatesan, B. J. Kooi, , G.
Palasantzas, Jeff T.M. De Hosson, Piezoelectric
properties of PbTiO3 thin films characterized with piezoresponse force
and high resolution transmission electron microscopy, J. Appl. Phys. 105,
064106 (2009).
[166] P.J.
van Zwol, G. Palasantzas, J. Th. M de Hosson, Weak dispersive forces between glass-gold
macroscopic surfaces in alcohols, Phys. Rev. E 79, 041605 (2009).
[167] P.J.
van Zwol, G. Palasantzas, J. Th. M de Hosson, The influence of dielectric properties on van der
Waals/Casimir forces in solid-liquid systems, Phys. Rev. B 79, 195428 (2009).
[168] G.
Palasantzas, V. B. Svetovoy, P.J. van Zwol, Influence of water adsorbed on gold on van der
Waals/Casimir forces, Phys. Rev. B 79, 235434 (2009).
[169] A.
Morelli, S. Venkatesan, G. Palasantzas,
B.J. Kooi, J. DeHosson, Piezoresponse Force Microscopy Characterization of PTO
Thin Films, To appear in Mat. Res. Soc. Symp.
Proc. (2009).
[170] Ramanathaswamn Pandian, Bart J. Kooi, Jasper Oosthoek, Pim van den Dool,
George Palasantzas, Andrew Pauza,
Polarity-dependent resistance switching in GeSbTe phase-change
thin films: The importance of excess Sb in filament formation, Appl. Phys.
Lett. 95, 252109 (2009).
[171] P.J.
van Zwol, V. B. Svetovoy,
G. Palasantzas, The distance upon contact: Determination from roughness
profile, Phys. Rev. B 80, 235401 (2009).
[172] G.
Palasantzas and P. J. van Zwol, Kinetic roughening and optical properties effects on Casimir and vdW forces (Zakopane School
of Physics/Breaking Frontiers: Submicron
Structures in Physics and Biology), Act. Phys. Pol. A 117, 379 (2010)
[173] O. Ergincan, G. Palasantzas, and B. J. Kooi, Influence of random roughness on cantilever curvature
sensitivity, Appl. Phys. Lett. 96, 041912 (2010)
[174] Gopi Krishnan, B.J. Kooi,
G. Palasantzas, Y.Pivak, B.Dam, Thermal stability of gas phase magnesium
nanoparticles, J. Appl.Phys. 107, 053504 (2010).
[175] Gopi Krishnan, G. Palasantzas, B.J. Kooi, Formation and Stability of Hollow MgO Nanoshells, J. Nanoscience
and Nanotechnology, 10, 4374 (2010).
[176] P.J.
van Zwol and G. Palasantzas, Repulsive
Casimir forces between solid materials with high refractive index intervening
liquids, Phys. Rev. A 81, 062502 (2010).
[177] G.
Torricelli, P. J. van Zwol, O. Shpak, C. Binns, G.
Palasantzas, B.J. Kooi, V.
B. Svetovoy, M. Wuttig, Switching Casimir forces with Phase Change Materials, Phys. Rev. A 82, 010101 (2010) (RC).
[178] G.
Palasantzas, in New Scientist (Tech, July 2, 2010): Casimir
effect put to work as a nano-switch /
Written by E.
Samuel
[179] P. J.
van Zwol and G. Palasantzas, Surface
Roughness and Material Optical Properties Influence on Casimir/van der Waals
and Capillary Surface Forces, Advanced Science Letters 3 (4), 358 (2010)
[180] Gopi Krishnan, G. Palasantzas, and B. J. Kooi, Improved thermal Stability of gas-phase Mg
nanoparticles for hydrogen storage, Appl. Phys. Lett. 97, 131911 (2010)
[181] O. Ergincan and G. Palasantzas, Influence of random
roughness on cantilever resonance frequency, Phys. Rev. B 82, 155438
(2010).
[182] G.
Palasantzas, V. B. Svetovoy, and P. J. van Zwol, OPTICAL PROPERTIES AND KINETIC ROUGHENING INFLUENCE
ON DISPERSIVE CASIMIR AND VAN DER WAALS FORCES, International Journal of Modern
Physics B 24, 6013 (2010)
[183] P. J.
van Zwol, G. Palasantzas, B.J. Kooi, O. Shpak, G. Torricelli,
C. Binns, V. B. Svetovoy,
M. Wuttig, Casimir forces and Phase Change Materials, Proceedings E\PCOS 2010, Milan, Italy, http://www.epcos.org/library/papers/pdf_2010/Oral/C03-BJKooi.pdf
[184] Gopi Krishnan, G. Palasantzas, and B. J. Kooi, Influence of Ti on
the formation and stability of gas-phase Mg nanoparticles, Appl. Phys.
Lett. 97, 261912 (2010)
[185] P. J.
van Zwol, V.B. Svetovoy,
and G. Palasantzas, Characterization
of optical properties and surface roughness profiles: The Casimir force between
real materials, in Lecture Notes in Physics Springer-Verlag(2011), ed. by D. Dalvit,
P. Milonni, D. Roberts, F. da Rosa.
[186] Wijnand Broer, George
Palasantzas, Jasper Knoester and Vitaly B. Svetovoy,
Roughness correction to the Casimir force beyond perturbation theory, Europhysics Letters, 95, 30001 (2011)
[187] O. Shpak and G. Palasantzas, Analysis of Casimir
forces with window functions: Kramers-Kronig general
approach for real measured dielectric data, PHYSICAL REVIEW A 84,
044501 (2011).
[188] H. J. Kroezen, G. Eising, G. ten
Brink, G. Palasantzas, B. J. Kooi, and A. Pauza, Schottky barrier
formation at amorphous-crystalline interfaces of GeSb phase
change materials, APPLIED PHYSICS LETTERS 100, 094106 (2012)
[189] Wijnand Broer, George
Palasantzas, and Jasper Knoester, Vitaly Svetovoy, Roughness
correction to the Casimir force at short separations: Contact distance and
extreme value statistics, PHYSICAL REVIEW B 85, 155410 (2012)
[190] O. Ergincan, G. Palasantzas, and B. J. Kooi, Influence of surface modification on the quality
factor of microresonators, Phys. Rev. B 85,
205420 (2012)
[191] G.
Torricelli, P. J. van Zwol, O. Shpak, G. Palasantzas, V. B. Svetovoy,
C. Binns, B. J. Kooi,
P. Jost, and M. Wuttig, Casimir Force
Contrast Between Amorphous and Crystalline Phases of AIST, Advanced Functional Materials, 22, 3729�3736 (2012)
[192] O. Ergincan, G. Palasantzas, and B. J. Kooi, Viscous damping
of microcantilevers with modified surfaces
and geometries, Appl. Phys.
Lett. 101, 061908-1 (2012)
[193] Wijnand Broer, George
Palasantzas, and Jasper Knoester, Vitaly B. Svetovoy, Significance
of the Casimir force and surface roughness for actuation dynamics of
MEMS, Phys. Rev.
B 87, 125413 (2013)
[194] G.
Krishnan, M. A. Verheijen, G. H. ten Brink, G. Palasantzas and B. J. Kooi, Tuning structural motifs and alloying of bulk
immiscible Mo�Cu
bimetallic nanoparticles by gas-phase synthesis, Nanoscale
5, 5375 (2013)
[195] M. Sedighi,
W. H. Broer, B. J. Kooi and
G. Palasantzas, Sensitivity of
micromechanical actuation on amorphous to crystalline phase transformations
under the influence of Casimir forces, Phys. Rev. B 88, 165423 (2013)
[196] T. Halpin-Healy and G.Palasantzas, Universal
correlators and distributions as experimental signatures of (2 +
1)-dimensional Kardar-Parisi-Zhang
growth, Europhysics Lett. 105 50001
(2014)
[197] V. B. Svetovoy and G. Palasantzas, Graphene-on-Silicon
Near-Field Thermophotovoltaic Cell, Phys. Rev. Applied 2, 034006 (2014)
[198] O. Ergincan, G. Palasantzas, and B. J. Kooi, Spring constant calibration of nanosurface-engineered atomic force microscopy
cantilevers, Review of Scientific Instruments , 85 (2),
026118-1-026118-3 (2014)
[199] M. Sedighi, V. B. Svetovoy, W.
H. Broer,� and G.
Palasantzas, Casimir forces from conductive silicon carbide surfaces,
Phys. Rev. B 89, 195440 (2014)
[200] M. Sedighi and
G. Palasantzas, Casimir and hydrodynamic force influence on microelectromechanical
system actuation in ambient conditions, Appl. Phys. Lett. 104, 074108
(2014)
[201] G. Krishnan, R.
F. Negrea, C. Ghica, G. H. ten Brink, B.
J. Kooi and G. Palasantzas, Synthesis
and exceptional thermal stability of Mg-based bimetallic nanoparticles during
hydrogenation, Nanoscale 6, 11963 (2014)
[202] G. H. ten Brink, G. Krishnan, B. J. Kooi, G.
Palasantzas, Copper nanoparticle
formation in a reducing gas environment, Journal of Applied Physics 116, 104302
(2014)
[203] O. Ergincan, B. J. Kooi, G.
Palasantzas, Surface engineering of the quality factor of metal coated microcantilevers, Journal
of Applied Physics 116, 104302 (2014)
[204] V. B. Svetovoy and
G. Palasantzas, Influence of surface roughness on dispersion forces
(Review Article), Advances in Colloid and Interface Science 216, 1 (2015)
[205] G. H.
ten Brink, N. Foley, D. Zwaan, B. J. Kooi and G. Palasantzas, Roughness controlled superhydrophobicity on single nanometer length scale
with metal nanoparticles, RSC Adv., 5, 28696 (2015)
[206] Mehdi Sedighi and George Palasantzas, Influence of low
optical frequencies on actuation dynamics of microelectromechanical systems via
Casimir forces, J. Appl. Phys. 117, 144901 (2015)
[207] T. Jamali, S. Vasheghani Farahani, M. Jannesar, G.
Palasantzas and G. R. Jafari, Surface
coupling effects on the capacitance of thin insulating films, J. Appl.
Phys. 117, 175308 (2015)
[208] G.
Palasantzas, D. A. R. Dalvit, R.
Decca, V. B Svetovoy and A. Lambrecht, Preface Casimir Physics, J. Phys.: Condens. Matter 27, 210301 (2015)
[209] M Sedighi, W H Broer, S
Van der Veeke, V B Svetovoy and G
Palasantzas, Influence of materials' optical response on actuation
dynamics by Casimir forces, J. Phys.: Condens.
Matter 27, 214014 (2015)
[210] W. Broer, H. Waalkens, V.
B. Svetovoy, J. Knoester,
and G. Palasantzas, Nonlinear Actuation Dynamics of Driven Casimir Oscillators
with Rough Surfaces, Phys. Rev. Applied 4, 054016 (2015)
[211] M. Sedighi,
V. B. Svetovoy, and G. Palasantzas, Casimir
force measurements from silicon carbide surfaces, Phys. Rev. B 93, 085434
(2016)
[212] G. H. ten Brink, P. J. van het Hof, B. Chen, M. Sedighi,
B. J. Kooi, G. Palasantzas, Control
surface wettability with nanoparticles from phase-change materials, Appl. Phys. Lett. 109, 234102
(2016)
[213] Bin Chen, Gert H.
ten Brink, George Palasantzas & Bart J. Kooi,
Size-dependent and tunable crystallization of GeSbTe phasechange nanoparticles, Scientific Reports
6, 39546 (2016)
[214] Lijuan Xing, Gert H
ten Brink, Bin Chen, Franz P Schmidt, Georg Haberfehlner, Ferdinand Hofer, Bart J Kooi and George Palasantzas, Synthesis and
morphology of iron�iron
oxide core�shell
nanoparticles produced by high pressure gas
condensation, Nanotechnology 27, 215703 (2016)
[215] Lijuan Xing, Gert H ten Brink, Bart
J Kooi and George
Palasantzas, Preparation of tunable-sized iron nanoparticles based on
magnetic manipulation in inert gas condensation (IGC), J. Appl.
Phys. 121, 024305 (2017).
[216] Bin
Chen, Gert H. ten Brink, George
Palasantzas, and Bart J. Kooi, Crystallization Kinetics of GeSbTe Phase-Change
Nanoparticles Resolved by Ultrafast Calorimetry, J.
Phys. Chem. C, 121, 8569 (2017).
[217] Fatemeh Tajik, Mehdi Sedighi,
George Palasantzas, Sensitivity
on materials optical properties of single beam torsional Casimir actuation,
Journal of Applied Physics 121, 174302 (2017)
[218] V.
B. Svetovoy, A. E. Melenev,
M. V. Lokhanin, and G. Palasantzas, Global
consequences of a local Casimir force: Adhered cantilever, Appl. Phys. Lett.
111, 011603 (2017)
[219] Gopi Krishnan, Sytze de Graaf, Gert H. ten
Brink, Per O.A. Persson, Bart J. Kooi and George Palasantzas, Strategies to initiate and
control the nucleation behavior of bimetallic nanoparticles, Nanoscale 9, 24,
8149 (2017)
[220] Solmaz Torabi, Megan Cherry,
Elisabeth A. Duijnstee, Vincent M. Le Corre, Li Qiu, Jan C. Hummelen, George Palasantzas, and L. Jan Anton Koster, A Rough Electrode
Creates Excess Capacitance in Thin Film Capacitors, ACS Appl. Mater. Interfaces 9 (32),
27290 (2017)
[221] Fatemeh Tajik, Mehdi Sedighi, Mohammad Khorrami, Amir Ali Masoudi,
and George Palasantzas, Chaotic behavior in Casimir oscillators: A case study
for phase-change materials, Phys. Rev. E 96, 042215 (2017)
[222] Gopi Krishnan, Sytze de Graaf, Gert H. ten
Brink, Marcel A. Verheijen Bart J. Kooi and
George Palasantzas, Shape and structural motifs control of MgTi bimetallic
nanoparticles using hydrogen and methane as trace impurities, Nanoscale 10,
1297 (2018)
[223] Bin Chen,
Dennis de Wal, Gert H.
ten Brink, George Palasantzas, Bart J. Kooi,
Resolving Crystallization Kinetics of GeTe Phase-Change
Nanoparticles by Ultrafast Calorimetry, Crystal growth & design 18, 1041
(2018)
[224] Fatemeh Tajik, Mehdi Sedighi,
Amir Ali Masoudi, Holger Waalkens, and George Palasantzas, Dependence of chaotic
actuation dynamics of Casimir oscillators on optical properties and
electrostatic effects, Eur. Phys. J. B 91, 71 (2018)
[225] Fatemeh Tajik,
Mehdi Sedighi, Amir Ali Masoudi,
Holger Waalkens, and George Palasantzas, Dependence of chaotic behavior on optical properties
and electrostatic effects in double-beam torsional Casimir actuation,
Phys. Rev. E 98.022210 (2018)
[226] Le Cunuder, A., Petrosyan,
A., Palasantzas, G., Svetovoy,
V. & Ciliberto, S.,
Measurement of the Casimir force in a gas and in a liquid, Physical Review B. 98, 201408 (2018).
[227] Chen, B., Do, V. L., Palasantzas,
G., Rudolf, P. & Kooi, B. J.,
Dynamics of GeSbTe phase-change nanoparticles
deposited on graphene, Nanotechnology. 29, 505706 (2018)
[228]
Farnaz Foadi, Gert H. ten Brink, Mohammad Reza Mohammadizadeh,
and George Palasantzas, Roughness dependent wettability of sputtered copper
thin films: The effect of the local surface slope, J. Appl. Phys. 125, 244307
(2019).
[229]
F. Tajik, M. Sedighi,
A. A. Masoudi, H. Waalkens,
and G. Palasantzas, Sensitivity
of chaotic behavior to low optical frequencies of a double-beam torsional actuator,
Phys. Rev. E 100, 012201
(2019).
[230] Farnaz Foadi, S. Mehdi Vaez Allaei, George Palasantzas, and Mohammad Reza Mohammadizade, Roughness-dependent wetting behavior of
vapor-deposited metallic thin films, Phys. Rev. E 100, 022804 (2019).
[231]
Effect
of Airborne Hydrocarbons on the Wettability of Phase Change Nanoparticle
Decorated Surfaces, Guo, W., Chen, B., Do, V. L., Ten
Brink, G. H., Kooi, B. J., Svetovoy, V. B. & Palasantzas,
G., 1-Jan-2019, In : Acs Nano.
[232]
Dependence
of non-equilibrium Casimir forces on material optical properties toward chaotic
motion during device actuation, Tajik, F., Babamahdi, Z., Sedighi, M., Masoudi,
A. A. & Palasantzas,
G., Sep-2019, In : Chaos. 29, 9, 11 p., 093126.