Skip to ContentSkip to Navigation
OnderzoekZernike (ZIAM)

Refereed academic publications of 1999

Materials Science
  1. Agterveld, D.T.L.v., Palasantzas, G. & De Hosson, J.T.M. Magnesium surface segregation and oxidation in Al-Mg alloys studied with local probe scanning Auger-scanning electron microscopy. Applied Surface Science 152 (3-4) 250-258 (1999)

  2. Agterveld, D.T.L.v., Palasantzas, G. & De Hosson, J.T.M. Surface sensitivity effects with local probe scanning Auger- scanning electron microscopy. Applied Physics Letters 75 (8) 1080-1082 (1999)

  3. Carvalho, N.J.M., Veld, A.J.H.i.'. & De Hosson, J.T.M. Microstructural investigations of interfaces in PVD TiN coated tool steels. Intergranular and Interphase Boundaries in Materials, Iib98 294-2 251-254 (1999)

  4. De Hosson, J.T.M., Goren, H.B., Kooi, B.J. & Vitek, V. Metal-ceramic interfaces studied with high-resolution transmission electron microscopy. Acta Materialia 47 (15-16) 4077-4092 (1999)

  5. De Hosson, J.T.M. & Teeuw, D.H.J. Nanoceramic coatings produced by laser treatment. Surface Engineering 15 (3) 235-241 (1999)

  6. Groen, H.B., Kooi, B.J., Vellinga, W.P. & De Hosson, J.T.M. High-resolution transmission electron microscopy imaging of misfit-dislocation networks at Cu-MgO and Cu-MnO interfaces. Philosophical Magazine A-Physics of Condensed Matter Structure Defects and Mechanical Properties 79 (9) 2083-2101 (1999)

  7. Groen, H.B., Kooi, B.J., Vellinga, W.P. & De Hosson, J.T.M. High resolution electron microscopy of misfit dislocations at metal-oxide interfaces. Intergranular and Interphase Boundaries in Materials, Iib98 294-2 107-110 (1999)

  8. Hegeman, J.B.J.W., Kooi, B.J., Groen, H.B. & De Hosson, J.T.M. Analyses of small facets imaged with scanning-probe microscopy. Journal of Applied Physics 86 (7) 3661-3669 (1999)

  9. Kooi, B.J., Westers, A.R., Vreeling, J.A., Agterveld, D.T.L.v. & De Hosson, J.T.M. Modification of metal/oxide interfaces by dissolution of Sb in oxide precipitates containing metal matrices. Intergranular and Interphase Boundaries in Materials, Iib98 294-2 255-258 (1999)

  10. Kooi, B.J., Kabel, M., Kloosterman, A.B. & De Hosson, J.T.M. Reaction layers around SiC particles in Ti: An electron microscopy study. Acta Materialia 47 (10) 3105-3116 (1999)

  11. Kooi, B.J., De Hosson, J.T.M., Olivier, C. & Veyret, J.B. Structure-property relations for silicon nitride matrix composites reinforced with pyrolytic carbon pre-coated Hi- Nicalon fibers. Journal of Materials Science 34 (19) 4737-4749 (1999)

  12. Teeuw, D.H.J., de Haas, M. & De Hosson, J.T.M. Residual stress fields in sol-gel-derived thin TiO2 layers. Journal of Materials Research 14 (5) 1896-1903 (1999)

  13. van Veen, A., Schut, H., Fedorov, A.V., Neeft, E.A.C., Konings, R.J.M., Kooi, B.J. & De Hosson, J.T.M. Hydrogen implantation defects in MgO. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 147 (1-4) 216-220 (1999)

  14. Zhao, Y.P., Wang, G.C., Lu, T.M., Palasantzas, G. & De Hosson, J.T.M. Surface-roughness effect on capacitance and leakage current of an insulating film. Physical Review B 60 (12) 9157-9164 (1999)

  15. Zhao, Y.P., Palasantzas, G., Wang, G.C. & De Hosson, J.T.M. Surface/interface-roughness-induced demagnetizing effect in thin magnetic films. Physical Review B 60 (2) 1216-1226 (1999)

Last modified:22 October 2012 2.29 p.m.