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Lecture Andreas Meyer

Rooster

WanneerWaar
14 oktober 2011 FWN-Building 5118.-152, Nijenborgh 4, 9747 AG, Groningen
Speaker: Dr. Andreas Meyer
Affiliation:

Institut für Physikalische Chemie, Universität

Hamburg, Germany
Title: Directed self-assembly of Block Copolymers and Nanocomposites on Surfaces
Date: Fri Oct 14, 2011
Start: 14.00
Location: FWN-Building 5118.-152
Host: K.U. Loos
Telephone: +31 50 363 6768

Abstract

Controlling the structure of matter at the nanometer scale and assemble nanoparticles into arrays and networks in a controlled manner is the key to new technologies. Nanosphere lithography is one of the most simple and effective methods for the preparation of large-area, two-dimensional nanostructure arrays. Inorganic precursors of the desired nanoparticles were introduced into micelles. By bringing them onto surfaces they form lateral hexagonal long-range ordered structures. The nanoparticles have tuneable diameters and distances between 10 and 100 nm, controlled by the block lengths of the initial polymer.

Magnetic nanostructure arrays can be created using these monolayers as sputtering masks. The number of preparation steps is kept as low as possible to simplify the formation of the nanostructure array. The structure of the cores is transferred into the film via ion milling under normal incidence. The generated dots were made of (Co/Pt)2-multilayers. They show different magnetic behaviour, depending on their size, interparticle distance and milling time.

Directed self-assembling over large distances of nanoparticles and nano-composites can be reached by topographically or chemically pre-structured substrates. They are easily manufactured by lithography and reproducible with soft imprint lithography. Therefore, we developed a method to use optical storage media (CD, DVD, Blue-Ray) as master pattern for the creation of directed, long range ordered nanoparticle arrays.

AFM and SEM-investigations show highly ordered particles in large domains. Corresponding GISAXS patterns show strong hexagonal diffraction peaks. By analyzing the scattered intensity, we were able to determine the lateral scales of the structure. Furthermore, simulations of the diffraction patterns were successful generated and models with precise length scale parameters were calculated.

Laatst gewijzigd:22 oktober 2012 14:30