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Lecture Elisabeth Soergel


16 December 2009 FWN-Building 5114.0004, Nijenborgh 4, 9747 AG, Groningen
Speaker: Dr. Elisabeth Soergel
Affiliation: Institute of Physics, University of Bonn, Germany
Title: Fabrication, investigation, and applications of ferroelectric domains
Date: Wed Dec 16, 2009
Start: 11.00
Location: FWN-Building 5114.0004
Host: B. Noheda
Telephone: +31 50 363 4565


Scanning force microscopy (SFM) is known to allow for measurements with an astonishingly high resolution. SFM can also be utilized to locally alter the sample properties in a lithographic manner with the help of the tip. This makes it an ideal instrument to investigate and modify ferroelectric domains on the nanometer scale. Whereas domain patterns can be imaged using a variation of SFM, so called piezoresponse force microscopy (PFM), a voltage applied to the SFM tip allows to pole small-sized domains. In my talk I will start with an introduction to ferroelectric materials and their applications. I will then focus on piezoresponse force microscopy and present the capabilities of this detection technique for quantitative conclusions on the properties of ferroelectric domains such as their depth or the width of domain walls. Further on I will discuss possibilities for domain fabrication by means SFM but also by UV-laser irradiation. Finally I will outline how domain patterns can be converted into ultra-smooth single crystal superstructures suitable for the fabrication of low scattering loss photonic micro-components.

Last modified:22 October 2012 2.30 p.m.