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Lecture Thilo Glatzel


14 July 2009 FWN-Building 5111.0080, Nijenborgh 4, 9747 AG, Groningen
Speaker: Dr. Thilo Glatzel
Affiliation: Department of Physics, University of Base;. Switzerland
Title: Limits and applications of Kelvin Probe Force Microscopy
Date: Tue Jul 14, 2009
Start: 13.45
Location: FWN-Building 5111.0080
Host: Petra Rudolf
Telephone: +31 50 363 4736


Kelvin Probe Force Microscopy (KPFM) is a non destructive scanning probe technique enabling the determination of the locale work function difference down to the nanometer scale. Within the presentation the application of KPFM on the characterization of  solar cell devices as well as the analysis of material properties will be discussed. Tweaking this technique to the experimental limits allows the determination of potential fluctuations down the atomic scale with an energetic resolution in the mV regime. The understand of the high resolution results obtained on various samples like ionic crystals, TiO_2, and molecular assemblies needs the development of new theoretical models. First approaches to qualitatively and quantitatively explain the measurements will be presented.

Last modified:22 October 2012 2.31 p.m.