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OnderzoekZernike (ZIAM)Nanostructures of Functional Oxides

Electrical Measurements

Fig. 1 Keithley 4200 - SCS Parameter Analyzer
Fig. 1 Keithley 4200 - SCS Parameter Analyzer

The electrical characterizations can be done using :

  • Keithley 6517A Electrometer for measuring high resistance and small current measurements (100 aA resolution in 20 pA range).
  • Keithley 4200-SCS Parameter Analyzer with 4 SMU (source measure unit), 1 PMU (ultra-fast pulse measure unit), 1 CVU (capacitance voltage unit: 1kHz-10MHz ) and Remote Preamplifier/Switch module.
Fig. 2 Cypher ES - AFM
Fig. 2 Cypher ES - AFM
  • Keithley 6221 DC and AC current source (AC currents from 4 pA to 210 mA with sine waves up to 100 kHz).
  • Keithley 236/237 Source Measure Units.
  • Stanford Research Systems SR830 Lock-In Amplifiers.
  • Stanford Research Systems SR560 low noise Pre-Amplifier.
  • HP/Agilent 3458A, 3457A, 3478A DMM.
  • Agilent E4980A LCR (20Hz to 2MHz)
  • Agilent 4155B Semiconductor Parameter Analyzer
  • Cypher ES - Atomic Force Microscope
Laatst gewijzigd:07 februari 2018 11:49