Structure Investigations on Single-Crystal Gold Films

Fischer, W., Geiger, H., Rudolf, P. & Wissmann, P., Jul-1977, In : Applied Physics A: Materials Science & Processing. 13, 3, p. 245-253 9 p.

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  • W. Fischer
  • H. Geiger
  • P. Rudolf
  • P. Wissmann
Structure of epitaxially grown gold films of varying thickness (10-1000 Å) has been investigated using LEED, AES, resistivity measurements and X-ray diffraction analysis. Silicon 111-oriented crystals, which are prehandled to exhibit √3 × √3 R 30°-superstructure in the LEED pattern, serve as substrates. The gold films show a homogeneous structure with smooth surfaces and a marked (111)-orientation. The use of silicon substrates, however, is complicated by the fact, that silicon diffuses through the gold films to a small extent even at room temperature.
Original languageEnglish
Pages (from-to)245-253
Number of pages9
JournalApplied Physics A: Materials Science & Processing
Issue number3
Publication statusPublished - Jul-1977

ID: 14659935