Publication

Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors

Davis, K. K., Jellema, W., Yates, S. J. C., Ferrari, L., Baselmans, J. J. A., Kohno, K., Thoen, D., Murugesan, V. & Baryshev, A. M., Jan-2017, In : Ieee transactions on terahertz science and technology. 7, 1, p. 98-106 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

APA

Davis, K. K., Jellema, W., Yates, S. J. C., Ferrari, L., Baselmans, J. J. A., Kohno, K., ... Baryshev, A. M. (2017). Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors. Ieee transactions on terahertz science and technology, 7(1), 98-106. https://doi.org/10.1109/TTHZ.2016.2617869

Author

Davis, Kristina K. ; Jellema, Willem ; Yates, Stephen J. C. ; Ferrari, Lorenza ; Baselmans, Jochem J. A. ; Kohno, Kotaro ; Thoen, David ; Murugesan, Vignesh ; Baryshev, Andrey M. / Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors. In: Ieee transactions on terahertz science and technology. 2017 ; Vol. 7, No. 1. pp. 98-106.

Harvard

Davis, KK, Jellema, W, Yates, SJC, Ferrari, L, Baselmans, JJA, Kohno, K, Thoen, D, Murugesan, V & Baryshev, AM 2017, 'Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors', Ieee transactions on terahertz science and technology, vol. 7, no. 1, pp. 98-106. https://doi.org/10.1109/TTHZ.2016.2617869

Standard

Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors. / Davis, Kristina K.; Jellema, Willem; Yates, Stephen J. C.; Ferrari, Lorenza; Baselmans, Jochem J. A.; Kohno, Kotaro; Thoen, David; Murugesan, Vignesh; Baryshev, Andrey M.

In: Ieee transactions on terahertz science and technology, Vol. 7, No. 1, 01.2017, p. 98-106.

Research output: Contribution to journalArticleAcademicpeer-review

Vancouver

Davis KK, Jellema W, Yates SJC, Ferrari L, Baselmans JJA, Kohno K et al. Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors. Ieee transactions on terahertz science and technology. 2017 Jan;7(1):98-106. https://doi.org/10.1109/TTHZ.2016.2617869


BibTeX

@article{b41e785f10444d45a11a0c1b303e9963,
title = "Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors",
abstract = "We present results from the first vector beam pattern measurement ofmicrowave kinetic inductance detectors (MKIDs). Vector beam patterns require sampling of the E-field of the receiver in both amplitude and phase. MKIDs are inherently direct detectors and have no phase response to incoming radiation. We map the amplitude and phase patterns of the detector beam profile by adapting a two-source heterodyne technique. Our testing strategy recovers the phase information by creating a reference signal to trigger data acquisition. The reference is generated by mixing the slightly offset low-frequency signals from the output of the two synthesizers used to drive the submillimeter sources. The key requirement is that the time-series record always begins at the same set phase of the reference signal. As the source probe is scanned within the receiver beam, the wavefront propagation phase of the receiver changes and causes a phase offset between the detector output and reference signals. We demonstrated this technique on the central pixel of a test array operating at 350 GHz. This methodology will enable vector beam pattern measurements to be performed on direct detectors, which have distinct advantages reducing systematic sources of error, allowing beam propagation, and removing the far-field measurement requirement such that complicated optical systems can be measured at a point that is easily accessible, including the near field.",
keywords = "Direct detector, kinetic inductance detector (KID), phase response, radiation pattern, vector beam pattern.",
author = "Davis, {Kristina K.} and Willem Jellema and Yates, {Stephen J. C.} and Lorenza Ferrari and Baselmans, {Jochem J. A.} and Kotaro Kohno and David Thoen and Vignesh Murugesan and Baryshev, {Andrey M.}",
year = "2017",
month = "1",
doi = "10.1109/TTHZ.2016.2617869",
language = "English",
volume = "7",
pages = "98--106",
journal = "Ieee transactions on terahertz science and technology",
issn = "2156-342X",
publisher = "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC",
number = "1",

}

RIS

TY - JOUR

T1 - Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors

AU - Davis, Kristina K.

AU - Jellema, Willem

AU - Yates, Stephen J. C.

AU - Ferrari, Lorenza

AU - Baselmans, Jochem J. A.

AU - Kohno, Kotaro

AU - Thoen, David

AU - Murugesan, Vignesh

AU - Baryshev, Andrey M.

PY - 2017/1

Y1 - 2017/1

N2 - We present results from the first vector beam pattern measurement ofmicrowave kinetic inductance detectors (MKIDs). Vector beam patterns require sampling of the E-field of the receiver in both amplitude and phase. MKIDs are inherently direct detectors and have no phase response to incoming radiation. We map the amplitude and phase patterns of the detector beam profile by adapting a two-source heterodyne technique. Our testing strategy recovers the phase information by creating a reference signal to trigger data acquisition. The reference is generated by mixing the slightly offset low-frequency signals from the output of the two synthesizers used to drive the submillimeter sources. The key requirement is that the time-series record always begins at the same set phase of the reference signal. As the source probe is scanned within the receiver beam, the wavefront propagation phase of the receiver changes and causes a phase offset between the detector output and reference signals. We demonstrated this technique on the central pixel of a test array operating at 350 GHz. This methodology will enable vector beam pattern measurements to be performed on direct detectors, which have distinct advantages reducing systematic sources of error, allowing beam propagation, and removing the far-field measurement requirement such that complicated optical systems can be measured at a point that is easily accessible, including the near field.

AB - We present results from the first vector beam pattern measurement ofmicrowave kinetic inductance detectors (MKIDs). Vector beam patterns require sampling of the E-field of the receiver in both amplitude and phase. MKIDs are inherently direct detectors and have no phase response to incoming radiation. We map the amplitude and phase patterns of the detector beam profile by adapting a two-source heterodyne technique. Our testing strategy recovers the phase information by creating a reference signal to trigger data acquisition. The reference is generated by mixing the slightly offset low-frequency signals from the output of the two synthesizers used to drive the submillimeter sources. The key requirement is that the time-series record always begins at the same set phase of the reference signal. As the source probe is scanned within the receiver beam, the wavefront propagation phase of the receiver changes and causes a phase offset between the detector output and reference signals. We demonstrated this technique on the central pixel of a test array operating at 350 GHz. This methodology will enable vector beam pattern measurements to be performed on direct detectors, which have distinct advantages reducing systematic sources of error, allowing beam propagation, and removing the far-field measurement requirement such that complicated optical systems can be measured at a point that is easily accessible, including the near field.

KW - Direct detector

KW - kinetic inductance detector (KID)

KW - phase response

KW - radiation pattern

KW - vector beam pattern.

U2 - 10.1109/TTHZ.2016.2617869

DO - 10.1109/TTHZ.2016.2617869

M3 - Article

VL - 7

SP - 98

EP - 106

JO - Ieee transactions on terahertz science and technology

JF - Ieee transactions on terahertz science and technology

SN - 2156-342X

IS - 1

ER -

ID: 97538214