Publication

A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys

Rao, J., Zhang, X., Ocelik, V., Vainchtein, D., De Hosson, J. T. M., Liou, S-C. & Chiou, W-A., Aug-2018, In : Microscopy and Microanalysis. 24, S1, p. 12-13 2 p.

Research output: Contribution to journalArticleAcademicpeer-review

APA

Rao, J., Zhang, X., Ocelik, V., Vainchtein, D., De Hosson, J. T. M., Liou, S-C., & Chiou, W-A. (2018). A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys. Microscopy and Microanalysis, 24(S1), 12-13. https://doi.org/10.1017/S1431927618000557

Author

Rao, Jiancun ; Zhang, Xiaodong ; Ocelik, Vasek ; Vainchtein, David ; De Hosson, Jeff T. M. ; Liou, Sz-Chian ; Chiou, Wen-An. / A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys. In: Microscopy and Microanalysis. 2018 ; Vol. 24, No. S1. pp. 12-13.

Harvard

Rao, J, Zhang, X, Ocelik, V, Vainchtein, D, De Hosson, JTM, Liou, S-C & Chiou, W-A 2018, 'A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys', Microscopy and Microanalysis, vol. 24, no. S1, pp. 12-13. https://doi.org/10.1017/S1431927618000557

Standard

A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys. / Rao, Jiancun; Zhang, Xiaodong; Ocelik, Vasek; Vainchtein, David; De Hosson, Jeff T. M.; Liou, Sz-Chian; Chiou, Wen-An.

In: Microscopy and Microanalysis, Vol. 24, No. S1, 08.2018, p. 12-13.

Research output: Contribution to journalArticleAcademicpeer-review

Vancouver

Rao J, Zhang X, Ocelik V, Vainchtein D, De Hosson JTM, Liou S-C et al. A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys. Microscopy and Microanalysis. 2018 Aug;24(S1):12-13. https://doi.org/10.1017/S1431927618000557


BibTeX

@article{b7cb669f707a49438bde22f30afc1529,
title = "A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys",
author = "Jiancun Rao and Xiaodong Zhang and Vasek Ocelik and David Vainchtein and {De Hosson}, {Jeff T. M.} and Sz-Chian Liou and Wen-An Chiou",
year = "2018",
month = "8",
doi = "10.1017/S1431927618000557",
language = "English",
volume = "24",
pages = "12--13",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "S1",

}

RIS

TY - JOUR

T1 - A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys

AU - Rao, Jiancun

AU - Zhang, Xiaodong

AU - Ocelik, Vasek

AU - Vainchtein, David

AU - De Hosson, Jeff T. M.

AU - Liou, Sz-Chian

AU - Chiou, Wen-An

PY - 2018/8

Y1 - 2018/8

U2 - 10.1017/S1431927618000557

DO - 10.1017/S1431927618000557

M3 - Article

VL - 24

SP - 12

EP - 13

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S1

ER -

ID: 85462779