Femtosecond time-resolved MeV electron diffraction

Zhu, P., Zhu, Y., Hidaka, Y., Wu, L., Cao, J., Berger, H., Geck, J., Kraus, R., Pjerov, S., Shen, Y., Tobey, R. I., Hill, J. P. & Wang, X. J., 2-Jun-2015. 6 p.

Research output: Contribution to conferencePaperAcademic

  • Pengfei Zhu
  • Y. Zhu
  • Y. Hidaka
  • L. Wu
  • J. Cao
  • H. Berger
  • J. Geck
  • R. Kraus
  • S. Pjerov
  • Y. Shen
  • R. I. Tobey
  • J. P. Hill
  • X. J. Wang

We report the experimental demonstration of femtosecond electron diffraction using high-brightness MeV electron beams. High-quality, single-shot electron diffraction patterns for both polycrystalline aluminum and single-crystal 1T-TaS2 are obtained utilizing a 5 fC (similar to 3x10(4) electrons) pulse of electrons at 2.8 MeV. The high quality of the electron diffraction patterns confirms that electron beam has a normalized emittance of similar to 50 nm rad. The transverse and longitudinal coherence length is similar to 11 and similar to 2.5 nm, respectively. The timing jitter between the pump laser and probe electron beam was found to be similar to 100 fs (rms). The temporal resolution is demonstrated by observing the evolution of Bragg and superlattice peaks of 1T-TaS2 following an 800 nm optical pump and was found to be 130 fs. Our results demonstrate the advantages of MeV electrons, including large elastic differential scattering cross-section and access to high-order reflections, and the feasibility of ultimately realizing below 10 fs time-resolved electron diffraction.

Original languageEnglish
Number of pages6
Publication statusPublished - 2-Jun-2015
Externally publishedYes


  • ultrafast electron diffraction, high-brightness electron beam, coherent length, ultrafast electron imaging, GUN

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