Proceedings of the Society of Photo-optical Instrumentation Engineers, 0361-0748

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    Wiedner, M. C., Aalto, S., Amatucci, E. G., Baryshev, A., Battersby, C., Belitsky, V., Bergin, E. A., Borgo, B., Carter, R. C., Cooray, A., Corsetti, J. A., De Beck, E., Delorme, Y., Dipirro, M. J., Desmaris, V., Ellison, B., Gallego, J-D., Di Giorgio, A. M., Eggens, M., Gerin, M., Goldsmith, P. F., Goldstein, C., Helmich, F., Herpin, F., Hills, R. E., Hogerheijde, M. R., Huet, J-M., Hunt, L. K., Jellema, W., Keizer, G., Krieg, J-M., Kroes, G., Laporte, P., Laurens, A., Leisawitz, D. T., Lis, D., Martins, G. E., Mehdi, I., Meixner, M., Melnick, G., Milam, S. N., Neufeld, D. A., Nguyen Tuong, N., Plume, R., Pontoppidan, K. M., Quertier-Dagorn, B., Risacher, C., Staguhn, J. G., Viti, S. & Wyrowski, F., 1-Jul-2018, In : Proceedings of SPIE. 10698

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  2. Analysis techniques for complex field radiation pattern measurements

    Davis, K. K., Jellema, W., Yates, S. J. C., Groppi, C. E., Baselmans, J. J. A. & Baryshev, A., 1-Jul-2018, In : Proceedings of the SPIE. 10708

    Research output: Contribution to journalArticleAcademicpeer-review

  3. The MIRI Medium Resolution Spectrometer calibration pipeline

    Labiano, A., Azzollini, R., Bailey, J., Beard, S., Dicken, D., García-Marín, M., Geers, V., Glasse, A., Glauser, A., Gordon, K., Justtanont, K., Klaassen, P., Lahuis, F., Law, D., Morrison, J., Müller, M., Rieke, G., Vandenbussche, B. & Wright, G., 1-Jul-2016, In : Proceedings of the Society of Photo-optical Instrumentation Engineers. 9910

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  4. Towards integrated modelling: full image simulations for WEAVE

    Dalton, G., Ham, S. J., Trager, S., Abrams, D. C., Bonifacio, P., Aguerri, J. A. L., Middleton, K., Benn, C., Rogers, K., Stuik, R., Carrasco, E., Vallenari, A., Jin, S. & Lewis, J., 2-Aug-2016, In : Proceedings of the Society of Photo-optical Instrumentation Engineers. 9913, 8 p.

    Research output: Contribution to journalArticleAcademicpeer-review

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    de Gier, H. D., Braam, H. & Havenith, R., 2015, In : Proceedings of SPIE. 9567, 9567ON.

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