Characterization of Nanomaterials and Devices

Faculteit Science and Engineering
Jaar 2020/21
Vakcode WMNS009-08
Vaknaam Characterization of Nanomaterials and Devices
Niveau(s) master
Voertaal Engels
Periode semester I

Uitgebreide vaknaam Characterization of Nanomaterials and Devices
Leerdoelen At the end of this course students should be able to:
- describe different characterization techniques of materials, outline the principles on which they are based, and explain their limitations (level of attainment 1, 2) (LO1)
- classify the material properties that the various techniques probe (level of attainment 2) (LO2)
- distinguish the complementarity of the various characterization techniques and derive their relationships (level of attainment 4,5) (LO3)
- choose the characterization techniques to analyze relevant structure-property relationships in different materials and assess information derived therein (level of attainment 6) (LO4)
Omschrijving The aim of the course is to make students familiar with the most relevant characterization methods of materials, through a combination of lectures, hands-on experience, measurement demonstration, and data analysis. It is part of the framework of the core courses including the preparation of nanomaterials and devices (WMN008-10) and the fundamental and functional properties of nanomaterials (WMN010-11).

The course presents a broad view of different experimental characterization techniques and the principles on which they are based. The course is comprised of the following parts (Percentage of total course in parentheses):
Part 1. Surface and Single Molecule Techniques (Scanning Tunneling Microscopy (STM); Atomic Force Microscopy (AFM); (Near Field) Optical Microscopy; Electric and Magnetic Force Microscopy; Piezo Force Microscopy; Optical tweezers; Force Spectroscopy) (29%) (LO 1-4)
Part 2. X-ray Diffraction (X-rays and their interaction with matter; Sources of X-rays; Refraction and reflection from interfaces; Kinematical diffraction; Small angle X-ray scattering for material science and biology (SAXS); Surface sensitive gracing-incidence x-ray scattering/diffraction (GISAXS) (29%) (LO 1-4)
Part 3. Spectroscopy (Practical Spectroscopic; Vibrational Spectroscopy; Electronic Spectroscopy; Fluorescence Spectroscopy; Raman Spectroscopy) (25%) (LO1-4)
Part 4. Electron Microscopy and Diffraction (Introduction to Electron Microscopy; Image Formation and Contrast in the TEM (incl. Zernike Phase contrast; Electron diffraction in the TEM; dynamical diffraction and multislice approach) (17%) (LO 1-4)

Content of the practical assignments for the different course parts:
Part 1. Scanning Probe/Single Molecule Microscopy.
Part 2. Single-Crystal Diffraction
Part 3. Absorption, luminescence and excitation spectroscopy
Part 4. Computer simulations of diffraction patterns and atomic resolution images.

Part. Lecturer(s)(second examiner(s))/mode(s) of assessment:
1. Roos (Stohr)/WE, PR, R
2. Blake, Portale (Noheda)/WE, PR, R
3. Hildner (Pchenitchnikov)/WE, PR, R
4. Kooi (Blake)/WE, PR, R
Uren per week
Onderwijsvorm Hoorcollege (LC), Practisch werk (PRC), Werkcollege (T)
Toetsvorm Practisch werk (PR), Schriftelijk tentamen (WE), Verslag (R)
Vaksoort master
Coördinator prof. dr. ir. B.J. Kooi
Docent(en) dr. G.R. Blake ,prof. dr. R.M. Hildner ,prof. dr. ir. B.J. Kooi ,prof. dr. G. Portale ,prof. dr. W.H. Roos
Entreevoorwaarden The course assumes prior knowledge acquired from the nanoscience Guided Self-study (WMNS003-06) which contains the basics of organic and inorganic chemistry, solid state physics and quantum mechanics.

The course unit prepares students for Research Paper (WMS011-6), and Small research project and symposium (WMNS007-13), of the topmaster nanoscience in which the learning objectives attained are recommended as prior knowledge.

Assessment criteria and method for determining the final mark:
• The weights of the four lecture parts (for the final grade) are given in the course overview.
• Written exams: the final mark is based on the number of correct answers. The grade is given by the equation: 1+9*(score/max score). Marks for individual exam parts are not rounded off.
• Practical assignment: A practical assignment summary (report) has to be handed in before the exam for each course part to show that the students have performed the experimental assignments (pass/fail). The practicum is passed given the student did all the assignments.
• In case of a resit for a written exam the lecturer may decide to give an oral exam. In that case: Oral exam: the final mark is based on the number of correct answers and the quality of the discussion. The oral exam is documented using the nanoscience oral exam grading form.
• To pass the course the final mark should be 5.5 or higher in all parts individually. If a partial exam was not done the mark for the exam will be counted as a 0. Should the average be higher than 5.5, but one or more parts of the exam not passed the final mark will be 5 or lower. The final mark is rounded to the closest half mark, with the exception of the mark 5.5, which is not used.

In case the assessments have to take place online, the written exams for part 1, 2 and 4 will be adjusted to online written exams and the written exam of part 3 to an online oral exam from home.
Opmerkingen Literature:

Part 1. Surface and Single Molecule Techniques
Lecture Notes

Part 2. X-ray Diffraction
Elements of Modern X-ray Physics, 2nd Edition
Book by Des McMorrow and Jens Als-Nielsen
Print ISBN: 9780470973943, Online ISBN: 9781119970156

Part 3. Optical Spectroscopy
J. M. Hollas, Modern Spectroscopy 4th Edition, ISBN: 978-0-470-84416-8
C.N.Banwell, Fundamental of Molecular Spectroscopy,
ISBN-13: 978-0077079765
Lecture Notes

Part 4. Electron Microscopy
Lecture Notes
Opgenomen in
Opleiding Jaar Periode Type
MSc Nanoscience 1 semester I verplicht