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KVI - Center for Advanced Radiation Technology Events

Seminar: Lutz Schweikhard, Institute of Physics, University of Greifswald, Germany

When:Fr 23-11-2018 10:00 - 11:00
Where:Large conference room KVI-CART

Title: Multi-reflection time-of-flight mass spectrometers and their use for the study of short-lived isotopes and metal clusters


Time-of-Flight Mass Spectrometry (ToF MS) is a widely used technique, e.g. in (bio-)chemistry analytical applications. For increased mass resolving power and accuracy, reflectron ToF MS is used, where the ions are reflected by an “ion mirror”. If two such ion mirrors are combined the ions can be trapped between. These devices are called electrostatic ion-beam traps. Such a setup can be used for various investigations of the stored ions. One of the application is, again, mass spectrometry. And as the ion path can be extended by the repeated reflections, where the ions go back and forth several hundred of even thousand times, the resolving power can be increased to well above 100 000. The presentation will describe the instruments and present applications from nuclear science, with an outlook on atomic-cluster studies.